Organisation
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| Angebote für Studenten |
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Bereiche im
Nanotechnikum |
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Martin-Luther-Universität
Interdisziplinäres Zentrum für Materialwissenschaften
Nanotechnikum Weinberg
Heinrich-Damerow-Str. 4, D-06120 Halle, Germany
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 | W. Leitenberger, C. Eisenschmidt, H.-R. H?che
Position-resolved measurement of the polarization state in the forward-diffracted X-ray beam
Acta Cryst. A 52 (1996), 621-628 |
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H. Uniewski, J. Schreiber, S. Hildebrandt, H. S. Leipner
SEM CL studies on polar glide dislocations in CdTe
Mater. Sci. Eng. B 42 (1996), 313-316 |
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| H. S. Leipner, R. Scholz, F. Syrowatka, H. Uniewski, J. Schreiber
Study of copper aggregations at dislocations in GaAs
Mater. Sci. Eng. B 42 (1996), 186-189 |
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Schneider R., Syrowatka F., R?der A., Abicht H.-P., Woltersdorf J.
Identification of barium titanate phases by ELNES fingerprints
XI Europ. Congr. on Microscopy, Dublin 1996, Proc. CD-ROM T11-34 (1996), |
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F. Syrowatka, R. Scholz, H. Uniewski, J. Schreiber, H. S. Leipner
Wechselwirkung von Kupfer mit Versetzungen in GaAs
In: Rasterelektronenmikroskopie in der Materialpr?fung. Berlin: Deutscher Verband f?r Materialforschung und -pr?fung (1996), 287-292 |
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C. H?bner, H. S. Leipner, O. Storbeck, R. Krause-Rehberg
Defect characterization in plastically deformed undoped gallium arsenide
In: The physics of semiconductors. Ed. M. Scheffler, R. Zimmermann. Singapore: World Scientific 4 (1996), 2805-2808 |
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H. S. Leipner, C. H?bner, O. Storbeck, A. Polity, R. Krause-Rehberg
Defect characterization in plastically deformed undoped gallium arsenide
In: Semiconducting and insulating materials 1996. Piscataway: IEEE 1996 (1996), 283-286 |
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| C. G. Hübner, T.Staab, H. S. Leipner
TEM studies of the microstructure of pressureless sintered copper
phys. stat. sol. (a) 150 (1995), 653-660 |
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| H. S. Leipner, R. Krause-Rehberg, C. H?bner
Generation of point defects during plastic deformation of InP
Mater. Sci. Forum 196-201 (1995), 1267-1272 |
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| T. Sekiguchi, H. S. Leipner
Damage-induced luminescence in InP
Appl. Phys. Lett. 67, 25 (1995), 3777-3779 |
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