Interdisziplinäres Zentrum für Materialwissenschaften
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      Nanotechnikum
Martin-Luther-Universität
Interdisziplinäres Zentrum für Materialwissenschaften
Nanotechnikum Weinberg
Heinrich-Damerow-Str. 4,
D-06120 Halle, Germany
Tel.: +49 345 55 28471
Telefax:+49 345 55 27390 email: info@cmat.uni-halle.de
[Veröffentlichungen] [Graduierungsarbeiten] [Berichte] [Poster]
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unfortunately no abstract available Christian Koppka
Nasschemisches KOH-Ätzen von Si-Substraten.
Masterarbeit (2012),
 
unfortunately no abstract available Jörg Haeberle
Defektstudie an Fe-Cr-Legierungen.
Diplomarbeit (2012),
 
abstractA. A. Tonkikh, N. Geyer , B. Fuhrmann , H. S. Leipner , P. Werner
Pathway of Porous Silicon Formation Inside Si Nanowires Throughout Metal Assisted Etching.
MRS Proc. 1408 (2012), MRSF11
 
abstractMaurizio Roczen, Martin Schade, Enno Malguth, Gordon Callsen, Thomas Barthel, Orman Gref, Jan A. Töfflinger, Andreas Schöpke, Manfred Schmidt, Hartmut S. Leipner, Florian Ruske, Matthew R. Phillips, Axel Hoffmann, Lars Korte, Bernd Rech
Structural investigations of silicon nanostructures grown by self-organized island formation for photovoltaic applications.
Appl. Phys. A 108 (2012), 719-726
 
abstractD. Oriwol, M. Hollatz, M. Reinecke
Control of Dislocation Cluster Formation and Development in Silicon Block Casting.
En. Proc. 27 (2012), 66-69
 
abstractV. G. Talalaev, A. A. Tonkikha, N. D. Zakharov, A. V. Senichev, J. W. Tomm, P. Werner, B. V. Novikov, L. V. Asryan, B. Fuhrmann, J. Schilling, H. S. Leipner, A. D. Bouraulev, Yu. B. Samsonenko, A. I. Khrebtov, I. P. Soshnikov, G. E. Cirlin
Ligh-emitting tunneling nanostructures based on quantum dots in a Si and GaAs Matrix.
Semicond. 46, 11 (2012), 1460-1470
 
abstractJin-Biao Pang, Hartmut S. Leipner, Reinhard Krause-Rehberg, Zhu Wang, Kai Zhou. Hui Li
Thermal stability of defects in plastically deformed silicon studied by positron lifetime spectroscopy
Semicond. Sci. Technol. 27, 3 (2012), 035023
 
abstract Tino Rublack, Stefan Hartnauer, Michael Mergner, Markus Muchow, Martin Schade, Hartmut S. Leipner, Gerhard Seifert
Mechanism of selective removal of transparent layers on semiconductors using ultrashort laser pulses.
Proc. SPIE 8247 (2012), 82470Z
 
unfortunately no abstract available T. Bähr, H. Behnken, M. Lohan, M. Hollatz, D. Oriwol
Residual stresses in multicrystalline silicon: Test of different measurement techniques and comparison with simulation results.
EU PVSEC Proc. Frankfurt (2012), 642-646
 
unfortunately no abstract available M. Muchow
Defektuntersuchungen an CIGS-Schichten mit Hilfe der Positronenannihilation
Masterarbeit (2012),
 
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