Organisation
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Aktivitäten
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Kontakt |
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Angebote für Studenten |
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Bereiche im Nanotechnikum |
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Martin-Luther-Universität
Interdisziplinäres Zentrum für Materialwissenschaften
Nanotechnikum Weinberg
Heinrich-Damerow-Str. 4, D-06120 Halle, Germany
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Christian Koppka Nasschemisches KOH-Ätzen von Si-Substraten. Masterarbeit (2012), |
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Jörg Haeberle Defektstudie an Fe-Cr-Legierungen. Diplomarbeit (2012), |
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| A. A. Tonkikh, N. Geyer , B. Fuhrmann , H. S. Leipner , P. Werner Pathway of Porous Silicon Formation Inside Si Nanowires Throughout Metal Assisted Etching. MRS Proc. 1408 (2012), MRSF11 |
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| Maurizio Roczen, Martin Schade, Enno Malguth, Gordon Callsen, Thomas Barthel, Orman Gref, Jan A. Töfflinger, Andreas Schöpke, Manfred Schmidt, Hartmut S. Leipner, Florian Ruske, Matthew R. Phillips, Axel Hoffmann, Lars Korte, Bernd Rech Structural investigations of silicon nanostructures grown by self-organized island formation for photovoltaic applications. Appl. Phys. A 108 (2012), 719-726 |
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| D. Oriwol, M. Hollatz, M. Reinecke Control of Dislocation Cluster Formation and Development in Silicon Block Casting. En. Proc. 27 (2012), 66-69 |
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| V. G. Talalaev, A. A. Tonkikha, N. D. Zakharov, A. V. Senichev, J. W. Tomm, P. Werner,
B. V. Novikov, L. V. Asryan, B. Fuhrmann, J. Schilling, H. S. Leipner, A. D. Bouraulev, Yu. B. Samsonenko, A. I. Khrebtov, I. P. Soshnikov, G. E. Cirlin Ligh-emitting tunneling nanostructures based on quantum dots in a Si and GaAs Matrix. Semicond. 46, 11 (2012), 1460-1470 |
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| Jin-Biao Pang, Hartmut S. Leipner, Reinhard Krause-Rehberg, Zhu Wang, Kai Zhou. Hui Li Thermal stability of defects in plastically deformed silicon studied by positron lifetime spectroscopy Semicond. Sci. Technol. 27, 3 (2012), 035023 |
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| Tino Rublack, Stefan Hartnauer, Michael Mergner, Markus Muchow, Martin Schade, Hartmut S. Leipner, Gerhard Seifert Mechanism of selective removal of transparent layers on semiconductors using ultrashort laser pulses. Proc. SPIE 8247 (2012), 82470Z |
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T. Bähr, H. Behnken, M. Lohan, M. Hollatz, D. Oriwol Residual stresses in multicrystalline silicon: Test of different measurement techniques and comparison with simulation results. EU PVSEC Proc. Frankfurt (2012), 642-646 |
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M. Muchow Defektuntersuchungen an CIGS-Schichten mit Hilfe der Positronenannihilation Masterarbeit (2012), |
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