Organisation
|
|
|
|
|
Aktivitäten
|
|
|
|
|
|
|
|
|
|
|
Kontakt |
|
|
|
|
|
|
Angebote für Studenten |
|
|
|
|
Bereiche im Nanotechnikum |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Martin-Luther-Universität
Interdisziplinäres Zentrum für Materialwissenschaften
Nanotechnikum Weinberg
Heinrich-Damerow-Str. 4, D-06120 Halle, Germany
|
|
10 | 20 | 30 | 40 | 50 | 60 | 70 | 80 | 90 | 100 | 110 | 120 | 130 | 140 | 150 | 160 | 170 | 180 | 190 | 200 | 210 | 220 | 230 | 240 | 250 | 260 | 270 | 280 | 290 | 300 | 310 | 320 | 330 | 340 | 350 | 360 | 370 | 380 | 390 | 400 | 410 | 420 | 430 | 440 | 450 | 460 | 470 | 480 |490 | 500 | 510 | 520 | 530 | 536 | All
| H. S. Leipner, R. F. Scholz, N. Engler, F. B?rner, P. Werner, U. G?sele Diffusivity of arsenic interstitials in GaAs studied by sulfur in-diffusion Physica B 273-274 (1999), 697-700 |
|
| T. E. M. Staab, M. Haugk, A. Sieck, T. Frauenheim, H. S. Leipner Magic number vacancy aggregates in Si and GaAs - structure and positron lifetime studies Physica B 273-274 (1999), 501-504 |
|
| T. E. M. Staab, M. Haugk, T. Frauenheim, H. S. Leipner Magic number vacancy aggregates in GaAs: Structure and positron lifetime studies Phys. Rev. Lett. 83, 26 (1999), 5519-5522 |
|
| H. S. Leipner, R. F. Scholz, F. Syrowatka, J. Schreiber, P. Werner Copper diffusion in dislocation-rich gallium arsenide Phil. Mag. A 79,11 (1999), 2785-2802 |
|
| J. Neumann-Zdralek Elektronenmikroskopische Untersuchungen zur Fresnoitbildung in Bariumtitanatkeramik Dissertation (1999), |
|
| R. Krause-Rehberg, H. S. Leipner Positron annihilation in semiconductors Berlin: Springer-Verlag ISBN 3-540-64371-0 (1999), Springer series in solid-state sciences 127 |
|
|
E. Langer, S. D?britz, A. R?der, W. Hauffe Studies of polycrystalline materials by Pseudo Kossel technique Fresenius J. Anal. Chem. 365 (1999), 212-216 |
|
| N. Engler, H. S. Leipner, R. F. Scholz, P. Werner, F. Syrowatka, J. Schreiber, U. G?sele Investigations of extended defects after sulfur diffusion in GaAs Sol. State Phen. 69-70 (1999), 443-448 |
|
| F. Heyroth, H.-R. H?che and C. Eisenschmidt Contrast in X-ray section topographs of perfect silicon crystals using the Laue-Laue three-beam case of diffraction J. Appl. Cryst. 32 (1999), 489-496 |
|
| F. Heyroth, H.-R. H?che and C. Eisenschmidt Imaging of the energy flow in the three-beam case of X-ray diffraction J. Phys. D: Appl. Phys. 32 (1999), A133-138 |
|
10 | 20 | 30 | 40 | 50 | 60 | 70 | 80 | 90 | 100 | 110 | 120 | 130 | 140 | 150 | 160 | 170 | 180 | 190 | 200 | 210 | 220 | 230 | 240 | 250 | 260 | 270 | 280 | 290 | 300 | 310 | 320 | 330 | 340 | 350 | 360 | 370 | 380 | 390 | 400 | 410 | 420 | 430 | 440 | 450 | 460 | 470 | 480 |490 | 500 | 510 | 520 | 530 | 536 | All
|
|
|
|