IZM -> Publikationen

Martin-Luther-Universität
Interdisziplinäres Zentrum für Materialwissenschaften
Nanotechnikum Weinberg
Heinrich-Damerow-Str. 4,
D-06120 Halle, Germany

Tel.: +49 345 55 28471
Telefax:+49 345 55 27390 email: info@cmat.uni-halle.de

Nadine Geyer, Zhipeng Huang, Bodo Fuhrmann, Silko Grimm, Manfred Reiche, Trung-Kien Nguyen-Duc, Johannes de Boor, Hartmut S. Leipner, Peter Werner, Ulrich Gösele
Sub-20 nm Si/Ge superlattice nanowires by metal-assisted etching
Nano Lett. 9 (9) (2009), 3106-3110

G. Radhakrishnan, A. Freundlich, B. Fuhrmann
Chemical beam epitaxy of highly ordered network of tilted InP nanowires on silicon.
J. Cryst. Growth 311, 7 (2009), 1855-1858

Johannes de Boor, Nadine Geyer, Ulrich Gösele, Volker Schmidt
Three-beam interference lithography: upgrading a Lloyd?s interferometer for single-exposure hexagonal patterning.
Opt. Lett. 34, 12 (2009), 1783-1785

Martin Schade, Nadine Geyer, Bodo Fuhrmann, Frank Heyroth, Peter Werner, Hartmut S. Leipner
High-resolution analytical electron microscopy of silicon nanostructures
phys. stat. sol. (c) 6 (3) (2009), 690-695

Martin Schade, Nadine Geyer, Bodo Fuhrmann, Frank Heyroth, Hartmut S. Leipner
High-resolution analytical electron microscopy of catalytically etched silicon nanowires
Appl. Phys. A 95 (2009), 325-327

I. Abdulhalim, Alina Karabchevsky,Christian Patzig, Bernd Rauschenbach, Bodo Fuhrmann, Evgeni Eltzov, Robert Marks, Jian Xu, Fan Zhang, Akhlesh Lakhtakia
Surface-enhanced fluorescence from metal sculptured thin films with application to biosensing in water
Appl. Phys. Lett. 94 (2009), 063106

Ingmar Ratschinski, Frank Heyroth, Wolfgang Fränzel, Hartmut S. Leipner
Anisotropy of crack and dislocation formation in GaAs
phys. stat. sol. (c) (2009),

G. Radhakrishnan, A. Freundlich, I. Rusakova, B. Fuhrmann
Growth of semiconductor nanowires using rapidly and uniformly generated metal growth centers.
34th IEEE Photovoltaic specialists conference Philadelphia (2009), 1275-1277

Steffi Deiter, Christian Eisenschmidt, Thomas Teubner, Gerd Schadow, Uwe Jednritzki, Anne Kathrin Gerlitzke, Frank Syrowatkaa, Frank Heyroth, Torsten Boeck, Michael Hanke
Growth observations of SiGe/Si island by means of in?itu x-ray diffraction
Mater. Res. Soc. Symp. Proc. 1146 (2009), NN10-08

C. Patzig, B. Fuhrmann, H. S. Leipner, B. Rauschenbach
Silicon nanocolumns on nanosphere lithography templated substrates: Effects of sphere size and substrate temperature
J. Nanosci. Nanotechnol. 8, 12 (2008), 1-7