IZM -> Publikationen

Martin-Luther-Universität
Interdisziplinäres Zentrum für Materialwissenschaften
Nanotechnikum Weinberg
Heinrich-Damerow-Str. 4,
D-06120 Halle, Germany

Tel.: +49 345 55 28471
Telefax:+49 345 55 27390 email: info@cmat.uni-halle.de

Neha Sardana, Vadim Talalaev, Frank Heyroth, Georg Schmidt, Christian Bohley, Alexander Sprafke, Joerg Schilling
Localized surface plasmon resonance in the IR regime
Opt. Expr. 24, 1 (2016), 254-261

Martin Schade, Bodo Fuhrmann, Angelika Chassé, Frank Heyroth, Mauricio Roczen, Hartmut S. Leipner
Distinction between amorphous and crystalline silicon by means of electron energy-loss spectroscopy.
Appl. Phys. A (2015),

Mingyan Zhao, Lihua Li, Changren Zhou, Frank Heyroth, Bodo Fuhrmann, Karsten Maeder, Thomas Groth
Improved stability and cell response by intrinsic cross-linking of multilayers from collagen I and oxidized glycosaminoglycans.
Biomacromolecules (2014),

J. Schilling, V. Talalaev, A. Tonkikh, B. Fuhrmann, F. Heyroth, M. Otto
Enhanced non-radiative recombination in the vicinity of plasma-etched side walls of luminescing Si/Ge-quantum dot structures.
J. Appl. Phys. 103, 16 (2013), 161106

I. Ratschinski, H. S. Leipner, F. Heyroth, W. Mook, J. Michler, W. Fränzel, G. Leibiger and F. Habel
Cracks and dislocations at Vickers, Berkovich and cube corner indentations in (0001) GaN single crystals
physica status solidi c 10 (1) (2013), 76-79

I. Ratschinski, H.S. Leipner, F. Heyroth, W. Fränzel, G. Leibiger, F. Habel
The effect of the indenter orientation on the formation of dislocations and cracks in (0001) GaN bulk crystals.
Mater. Sci. Forum 725 (2012), 67-70

N. Sardana, F. Heyroth, J. Schilling
Propagating surface plasmons on nanoporous gold.
JOSA B 29, 7 (2012), 1778-1783

S. Hollstein, E. Hoffmann, J. Vogel, F. Heyroth, N. Prochnow, P. Maurer
Micromorphometrical analyses of five different ultrasonic osteotomy devices at the rabbit skull.
Clin. Oral Implants Res. 22, 5 (2011),

I. Ratschinski, H. S. Leipner, F. Heyroth, W. Fränzel, R. Hammer, M. Jurisch
Dislocations and cracks at Vickers indentations in GaN and GaAs bulk crystals.
phys. stat. sol. (c) 8, 4 (2011), 1325-1329

Ingmar Ratschinski, Hartmut S. Leipner, Frank Heyroth, Wolfgang Fränzel, Osama Moutanabbir, Ralf Hammer, Manfred Jurisch
Indentation-induced dislocations and cracks in (0001) freestanding and epitaxial GaN.
J. Phys. Conf. Ser. 281, 1 (2011), 012007

A. Szeghalmi, M. Helgert,R. Brunner, F. Heyroth,U. Gosele, M. Knez
Tunable Guided-Mode Resonance Grating Filter
Adv. Funct. Mater. 20, 13 (2010), 2053-2062

K. Rothe, M. Stordeur, F. Heyroth, F. Syrowatka, H.S. Leipner
Electrical and structural real-time changes in thin thermoelectric (Bi_0.15Sb_0.85)₍₂₎Te₃ films by dynamic thermal treatment.
J. Electron. Mater. 39, 9 (2010), 1408-1412

I. Ratschinski, H. S. Leipner, F. Heyroth, W. Fränzel, R. Hammer, M. Jurisch
Dislocations and cracks at Vickers indentations in (0001) GaN single crystals.
Phil. Mag. Lett. 90 (8) (2010), 565-571

Katrin Bertram, Matthias Stordeur, Frank Heyroth, Hartmut S. Leipner
Dynamic in situ observations of electrical and structural changes in thin thermoelectric (Bi_0.15Sb_0.85)₂Te₃ films
J. Appl. Phys. 106 (6) (2009), 063711

Adriana Szeghalmi, Michael Helgert, Robert Brunner, Frank Heyroth, Ulrich Gösele, Mato Knez
Atomic layer deposition of Al₂O₃ and TiO₂ multilayers for applications as bandpass filters and antireflection coatings.
Appl. Optics 48 (9) (2009), 1727-1732

Martin Schade, Nadine Geyer, Bodo Fuhrmann, Frank Heyroth, Peter Werner, Hartmut S. Leipner
High-resolution analytical electron microscopy of silicon nanostructures
phys. stat. sol. (c) 6 (3) (2009), 690-695

Martin Schade, Nadine Geyer, Bodo Fuhrmann, Frank Heyroth, Hartmut S. Leipner
High-resolution analytical electron microscopy of catalytically etched silicon nanowires
Appl. Phys. A 95 (2009), 325-327

Ingmar Ratschinski, Frank Heyroth, Wolfgang Fränzel, Hartmut S. Leipner
Anisotropy of crack and dislocation formation in GaAs
phys. stat. sol. (c) (2009),

Steffi Deiter, Christian Eisenschmidt, Thomas Teubner, Gerd Schadow, Uwe Jednritzki, Anne Kathrin Gerlitzke, Frank Syrowatkaa, Frank Heyroth, Torsten Boeck, Michael Hanke
Growth observations of SiGe/Si island by means of in?itu x-ray diffraction
Mater. Res. Soc. Symp. Proc. 1146 (2009), NN10-08

M. Schade, F. Heyroth, F. Syrowatka, H. S. Leipner, T. Boeck, M. Hanke
Investigation of the chemical composition profile of SiGe/Si(001) islands by analytical transmission electron microscopy
Appl. Phys. Lett. 90 (2007), 263101

Vladimir Sivakov, Frank Heyroth, Fritz Falk, Gudrun Andrä, Silke Christiansen
Silicon nanowire growth by electron beam evaporation: kinetic and energetic contributions to the growth morphology.
J. Cryst. Growth 300, 2 (2007), 288-293

M. Hanke, C. Eisenschmidt, P. Werner, N. D. Zakharov, R. Syrowatka, F. Heyroth, P. Schäfer, O. Konovalov
Elastic strain relaxation in axial Si/Ge whisker heterostructures
Phys. Rev. B 75 (2007), 161303R

M. Schade, F. Heyroth, H. S. Leipner, M. Hanke
Combined HRXRD and EELS investigations of SiGe/Si(001) islands grown by means of liquid phase epitaxy.
Microsc. Microanal. 13 (2007), Suppl. 3

M. Hanke, T. Boeck, A.-K. Gerlitzke, F. Syrowatka, F. Heyroth
Elastic strain relaxation in discontinuous wetting layers and its impact on lateral ordering of heteroepitaxial dots
Phys. Rev. B 74 (2006), 153304

M. Hanke, T. Boeck, A.-K. Gerlitzke, F. Syrowatka, F. Heyroth
Dedicated fabrication of silicon-based dot molecules with a specific and unique number of dots
Appl. Phys. Lett. 88 (2006), 063119

J. Zhang, F. Paumier, T. H?che, F. Heyroth, F. Syrowatka, R. J. Gaboriaud, H. S. Leipner
Electron energy-loss spectroscopy investigations of Y₂O₃ films on Si (001) substrate
Thin Sol. Films 496 (2006), 266-272

C. Heiliger, F. Heyroth, F. Syrowatka, H. S. Leipner, I. Maznichenko, K. Kokko, W. Hergert, I. Mertig
Orientation-dependent electron-energy-loss spectroscopy of TiO₂: A comparison of theory and experiment
Phys. Rev. B 73 (2006), 045129

T. H?che, F. Heyroth, M. Grodzicki, P. A. van Aken
Coordination of transition-metals in glasses from high-resolution electron energy-loss spectroscopy
phys. stat. sol. (a) 202, 12 (2005), 2355-2360

M. Hanke, T.Boeck, A.-K. Gerlitzke, F.Syrowatka, F. Heyroth
Unidirectional self-assembling of SiGe Stranski-Krastanow islands on Si(113)
Appl. Phys. Lett. 86 (2005), 223109

M.Hanke, T.Boeck, A.-K.Gerlitzke, F.Syrowatka, F.Heyroth, R.K?hler
Size, shape and ordering of LPE-SiGe/Si(001) islands grown under far non-equilibrium growth conditions
Appl. Phys. Lett. 86 (2005), 142101

J. Zhang, A. Visinoiu, F. Heyroth, F. Syrowatka, M. Alexe, D. Hesse, H. S. Leipner
High-resolution electron energy-loss spectroscopy of BaTiO₃/SrTiO₃ multilayers
Physical Review B 71 (2005), 064108-064114

T. H?che, P. A. van Aken, M. Grodzicki, F. Heyroth, R. Keding, R. Uecker
Electron energy-loss spectroscopy at incommensurately modulated crystalline and glassy Ba₂TiGe₂O₈
Phil. Mag. 84, 29 (2004), 3117-3132

P. A. van Aken, T. H?che, F. Heyroth, R. Keding, R. Uecker
Insights into oxygen-cation bonding in fresnoite-type structures from OK- and Ti L-23-electron energy-loss spectra and ab initio calculations of the electronic structure
Phys. Chem. Minerals 31, 8 (2004), 543-552

H.J. Fan, R. Scholz, F.M. Kolb, M. Zacharias, U. G?sele, F. Heyroth, C. Eisenschmidt, T. Hempel, J. Christen
On the growth mechanism and optical properties of ZnO multi-layer nanosheets
Applied Physics A 79 (8) (2004), 1895-1900

F. Heyroth, B. Fuhrmann
Nanostrukturen ? Von der Natur geschaffen
Scientia halensis 12, 2 (2004), 5-6

F. Heyroth, J. Zellner, H.-R. H?che, C. Eisenschmidt, E. Weckert, M. Drakopoulous
Pinhole topography in the three-beam case of x-ray diffraction - experiment and theory
J. Phys. D: Appl. Phys. 34, 10A (2001), 151-157

H.-R. Höche, A. Röder, F. Heyroth
Environmental Scanning Electron Microscopy (ESEM) an wasserhaltigen Objekten und Biomaterialien
Scientia halensis 9, 2 (2001), 7-8

Frank Heyroth
Röntgentopographischer Kontrast im Dreistrahlfall der Interferenz
Dissertation (2000),

F. Heyroth, H.-R. H?che and C. Eisenschmidt
Contrast in X-ray section topographs of perfect silicon crystals using the Laue-Laue three-beam case of diffraction
J. Appl. Cryst. 32 (1999), 489-496

F. Heyroth, H.-R. H?che and C. Eisenschmidt
Imaging of the energy flow in the three-beam case of X-ray diffraction
J. Phys. D: Appl. Phys. 32 (1999), A133-138

F. Heyroth, C. Eisenschmidt, H.-R. H?che
X-ray topography of perfect crystals using the Laue-Laue three-beam case of diffraction
Cryst. Res. Technol. 33 (1998), 547-554

C. Medrano, F. Heyroth, M. Schlenker, J. Baruchel and J.Espeso
Two- and Three-Beam X-ray Diffraction Imaging of Domains in Magnetite
J. Appl. Cryst. 31 (1998), 726-732