Interdisziplinäres Zentrum für Materialwissenschaften
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      Nanotechnikum
Martin-Luther-Universität
Interdisziplinäres Zentrum für Materialwissenschaften
Nanotechnikum Weinberg
Heinrich-Damerow-Str. 4,
D-06120 Halle, Germany
Tel.: +49 345 55 28471
Telefax:+49 345 55 27390 email: info@cmat.uni-halle.de
[Veröffentlichungen] [Graduierungsarbeiten] [Berichte] [Poster]
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abstractKatrin Bertram, Matthias Stordeur, Frank Heyroth, Hartmut S. Leipner
Dynamic in situ observations of electrical and structural changes in thin thermoelectric (Bi0.15Sb0.85)2Te3 films
J. Appl. Phys. 106 (6) (2009), 063711
 
abstractAdriana Szeghalmi, Michael Helgert, Robert Brunner, Frank Heyroth, Ulrich Gösele, Mato Knez
Atomic layer deposition of Al2O3 and TiO2 multilayers for applications as bandpass filters and antireflection coatings.
Appl. Optics 48 (9) (2009), 1727-1732
 
abstractMartin Schade, Nadine Geyer, Bodo Fuhrmann, Frank Heyroth, Peter Werner, Hartmut S. Leipner
High-resolution analytical electron microscopy of silicon nanostructures
phys. stat. sol. (c) 6 (3) (2009), 690-695
 
abstractMartin Schade, Nadine Geyer, Bodo Fuhrmann, Frank Heyroth, Hartmut S. Leipner
High-resolution analytical electron microscopy of catalytically etched silicon nanowires
Appl. Phys. A 95 (2009), 325-327
 
abstractIngmar Ratschinski, Frank Heyroth, Wolfgang Fränzel, Hartmut S. Leipner
Anisotropy of crack and dislocation formation in GaAs
phys. stat. sol. (c) (2009),
 
unfortunately no abstract available Steffi Deiter, Christian Eisenschmidt, Thomas Teubner, Gerd Schadow, Uwe Jednritzki, Anne Kathrin Gerlitzke, Frank Syrowatkaa, Frank Heyroth, Torsten Boeck, Michael Hanke
Growth observations of SiGe/Si island by means of in?itu x-ray diffraction
Mater. Res. Soc. Symp. Proc. 1146 (2009), NN10-08
 
abstractM. Schade, F. Heyroth, F. Syrowatka, H. S. Leipner, T. Boeck, M. Hanke
Investigation of the chemical composition profile of SiGe/Si(001) islands by analytical transmission electron microscopy
Appl. Phys. Lett. 90 (2007), 263101
 
abstractVladimir Sivakov, Frank Heyroth, Fritz Falk, Gudrun Andrä, Silke Christiansen
Silicon nanowire growth by electron beam evaporation: kinetic and energetic contributions to the growth morphology.
J. Cryst. Growth 300, 2 (2007), 288-293
 
abstractM. Hanke, C. Eisenschmidt, P. Werner, N. D. Zakharov, R. Syrowatka, F. Heyroth, P. Schäfer, O. Konovalov
Elastic strain relaxation in axial Si/Ge whisker heterostructures
Phys. Rev. B 75 (2007), 161303R
 
unfortunately no abstract available M. Schade, F. Heyroth, H. S. Leipner, M. Hanke
Combined HRXRD and EELS investigations of SiGe/Si(001) islands grown by means of liquid phase epitaxy.
Microsc. Microanal. 13 (2007), Suppl. 3
 
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