10th International Workshop on Beam Injection Assessment
of Microstructures in Semiconductors - BIAMS
2010

Halle (Saale) / Germany,    July 4 - 8, 2010

  
 
BIAMS 2010 Scientific committee::

O. Breitenstein

MPI of Microstructure Physics, Halle, Germany

A. Cavallini

University Bologna, Italy

M. Kittler

IHP Frankfurt(Oder) & IHP/BTU Joint Lab Cottbus, Germany

S.G. Konnikov

Ioffe Institute, St.Petersburg, Russia

J. Piqueras

University Complutense, Madrid, Spain

T. Sekiguchi

NIMS, Tsukuba, Japan

P. Sellin

University Surrey, UK

B. Sieber

Université Lille, France

N. Tabet

University King Fahd, Saudi Arabia

H. Tomokage

Fukuoka University, Japan

M. Troyon

Université Reims-Champagne-Ardenne, France

E. Yakimov

Institute of Microelectronics, Chernogolovka, Russia



BIAMS 2010 Advisory committee::

L. Brillson

Ohio State University, USA

H.J. Fitting

Rostock University, Germany

C. Frigeri

CNR-IMEM, Parma, Italy

J.D. Ganiere

EPFL, Switzerland

B. Grandidier

IEMN-CNRS, Lille, France

M. Kiskinova

Synchrotron Trieste, Italy

R.W. Martin

University Strathclyde, UK

E. Mena-Osteritz

University Ulm, Germany

M. Phillips

University of Technology, Sydney, Australia