Interdisziplinäres Zentrum für Materialwissenschaften
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      Nanotechnikum
Martin-Luther-Universität
Interdisziplinäres Zentrum für Materialwissenschaften
Nanotechnikum Weinberg
Heinrich-Damerow-Str. 4,
D-06120 Halle, Germany
Tel.: +49 345 55 28471
Telefax:+49 345 55 27390 email: info@cmat.uni-halle.de
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abstractKatrin Bertram, Matthias Stordeur, Frank Heyroth, Hartmut S. Leipner
Dynamic in situ observations of electrical and structural changes in thin thermoelectric (Bi0.15Sb0.85)2Te3 films
J. Appl. Phys. 106 (6) (2009), 063711
 
abstractV. A. Sivakov, R. Scholz, F. Syrowatka, F. Falk, U Gösele, S. H. Christiansen
Silicon nanowire oxidation: the influence of sidewall structure and gold distribution
Nanotechn. 20 (40) (2009), 405607
 
abstractAdriana Szeghalmi, Michael Helgert, Robert Brunner, Frank Heyroth, Ulrich Gösele, Mato Knez
Atomic layer deposition of Al2O3 and TiO2 multilayers for applications as bandpass filters and antireflection coatings.
Appl. Optics 48 (9) (2009), 1727-1732
 
abstractNadine Geyer, Zhipeng Huang, Bodo Fuhrmann, Silko Grimm, Manfred Reiche, Trung-Kien Nguyen-Duc, Johannes de Boor, Hartmut S. Leipner, Peter Werner, Ulrich Gösele
Sub-20 nm Si/Ge superlattice nanowires by metal-assisted etching
Nano Lett. 9 (9) (2009), 3106-3110
 
abstractG. Radhakrishnan, A. Freundlich, B. Fuhrmann
Chemical beam epitaxy of highly ordered network of tilted InP nanowires on silicon.
J. Cryst. Growth 311, 7 (2009), 1855-1858
 
abstractJohannes de Boor, Nadine Geyer, Ulrich Gösele, Volker Schmidt
Three-beam interference lithography: upgrading a Lloyd?s interferometer for single-exposure hexagonal patterning.
Opt. Lett. 34, 12 (2009), 1783-1785
 
abstractMartin Schade, Nadine Geyer, Bodo Fuhrmann, Frank Heyroth, Peter Werner, Hartmut S. Leipner
High-resolution analytical electron microscopy of silicon nanostructures
phys. stat. sol. (c) 6 (3) (2009), 690-695
 
abstractMartin Schade, Nadine Geyer, Bodo Fuhrmann, Frank Heyroth, Hartmut S. Leipner
High-resolution analytical electron microscopy of catalytically etched silicon nanowires
Appl. Phys. A 95 (2009), 325-327
 
abstractI. Abdulhalim, Alina Karabchevsky,Christian Patzig, Bernd Rauschenbach, Bodo Fuhrmann, Evgeni Eltzov, Robert Marks, Jian Xu, Fan Zhang, Akhlesh Lakhtakia
Surface-enhanced fluorescence from metal sculptured thin films with application to biosensing in water
Appl. Phys. Lett. 94 (2009), 063106
 
abstractIngmar Ratschinski, Frank Heyroth, Wolfgang Fränzel, Hartmut S. Leipner
Anisotropy of crack and dislocation formation in GaAs
phys. stat. sol. (c) (2009),
 
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