Interdisziplinäres Zentrum für Materialwissenschaften
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Martin-Luther-University
Interdisziplinäres Zentrum für Materialwissenschaften
Nanotechnikum Weinberg
Heinrich-Damerow-Str. 4,
D-06120 Halle, Germany
Phone: +49 345 55 28471
Telefax:+49 345 55 27390 e-mail: info@cmat.uni-halle.de
[Papers] [Theses] [Reports] [Posters]
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abstractM.Hanke, T.Boeck, A.-K.Gerlitzke, F.Syrowatka, F.Heyroth, R.K?hler
Size, shape and ordering of LPE-SiGe/Si(001) islands grown under far non-equilibrium growth conditions
Appl. Phys. Lett. 86 (2005), 142101
 
abstractJ. Zhang, A. Visinoiu, F. Heyroth, F. Syrowatka, M. Alexe, D. Hesse, H. S. Leipner
High-resolution electron energy-loss spectroscopy of BaTiO3/SrTiO3 multilayers
Physical Review B 71 (2005), 064108-064114
 
abstractT. H?che, P. A. van Aken, M. Grodzicki, F. Heyroth, R. Keding, R. Uecker
Electron energy-loss spectroscopy at incommensurately modulated crystalline and glassy Ba2TiGe2O8
Phil. Mag. 84, 29 (2004), 3117-3132
 
abstractP. A. van Aken, T. H?che, F. Heyroth, R. Keding, R. Uecker
Insights into oxygen-cation bonding in fresnoite-type structures from OK- and Ti L-23-electron energy-loss spectra and ab initio calculations of the electronic structure
Phys. Chem. Minerals 31, 8 (2004), 543-552
 
abstractH.J. Fan, R. Scholz, F.M. Kolb, M. Zacharias, U. G?sele, F. Heyroth, C. Eisenschmidt, T. Hempel, J. Christen
On the growth mechanism and optical properties of ZnO multi-layer nanosheets
Applied Physics A 79 (8) (2004), 1895-1900
 
abstractF. Heyroth, B. Fuhrmann
Nanostrukturen ? Von der Natur geschaffen
Scientia halensis 12, 2 (2004), 5-6
 
abstractF. Heyroth, J. Zellner, H.-R. H?che, C. Eisenschmidt, E. Weckert, M. Drakopoulous
Pinhole topography in the three-beam case of x-ray diffraction - experiment and theory
J. Phys. D: Appl. Phys. 34, 10A (2001), 151-157
 
unfortunately no abstract available H.-R. Höche, A. Röder, F. Heyroth
Environmental Scanning Electron Microscopy (ESEM) an wasserhaltigen Objekten und Biomaterialien
Scientia halensis 9, 2 (2001), 7-8
 
abstractFrank Heyroth
Röntgentopographischer Kontrast im Dreistrahlfall der Interferenz
Dissertation (2000),
 
abstractF. Heyroth, H.-R. H?che and C. Eisenschmidt
Contrast in X-ray section topographs of perfect silicon crystals using the Laue-Laue three-beam case of diffraction
J. Appl. Cryst. 32 (1999), 489-496
 
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