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Martin-Luther-University
Interdisziplinäres Zentrum für Materialwissenschaften
Nanotechnikum Weinberg
Heinrich-Damerow-Str. 4,
D-06120 Halle, Germany
Phone: +49 345 55 28471
Telefax:+49 345 55 27390 e-mail: info@cmat.uni-halle.de
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Abstracts

C. Medrano, F. Heyroth, M. Schlenker, J. Baruchel and J.Espeso
Two- and Three-Beam X-ray Diffraction Imaging of Domains in Magnetite
J. Appl. Cryst. 31 (1998), 726-732

High angular sensitivity is obtained in white-beam topographs made on a weak reflection when it is enhanced through Umweganregung by strong reflection.
© Journal of Applied Crystallography
Impressum Copyright © Center of Materials Science, Halle, Germany. All rights reserved.