Organisation
|
|
|
|
|
| Aktivitäten
|
|
|
|
|
|
|
|
|
|
|
| Kontakt |
|
|
|
|
|
|
| Angebote für Studenten |
|
|
|
|
Bereiche im
Nanotechnikum |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Martin-Luther-Universität
Interdisziplinäres Zentrum für Materialwissenschaften
Nanotechnikum Weinberg
Heinrich-Damerow-Str. 4, D-06120 Halle, Germany
|
|
10 | 20 | 30 | 40 | 50 | 60 | 70 | 80 | 90 | 100 | 110 | 120 | 130 | 140 | 150 | 160 | 170 | 180 | 190 | 200 | 210 | 220 | 230 | 240 | 250 | 260 | 270 | 280 | 290 | 300 | 310 | 320 | 330 | 340 | 350 | 360 | 370 | 380 | 390 | 400 | 410 | 420 | 430 | 440 | 450 | 460 | 470 | 480 | 490 |500 | 510 | All
 |
Schneider R., Woltersdorf J., R?der A.
EELS Nanoanalysis for Investigation Both Chemical Composition and Bonding of Interlayers in Composites
Mikrochimica Acta 125 (1997), 361-365 |
| |
|---|
 | W. Leitenberger, C. Eisenschmidt, H.-R. H?che
Lithium fluoride transmission phase retarder for X-rays
J. Appl. Cryst. 30 (1997), 164-170 |
| |
|---|
| E. A. Steinman, H. S. Leipner, H. G. Grimmeiss
The magnesium related luminescence in silicon and its quenching due to the presence of dislocations
Sol. State Phen. 57-58 (1997), 313-318 |
| |
|---|
|
C. H?bner, H. S. Leipner, R. Krause-Rehberg
Deformation induced defects in GaAs-The role of dislocations
Mater. Sci. Forum 255-257 (1997), 497-499 |
| |
|---|
| H. S. Leipner, J. Schreiber, H. Uniewski, S. Hildebrandt
Dislocation luminescence in cadmium telluride
Scanning Microsc. Intern. 11, 1 (1997), 149-160 |
| |
|---|
| W. Leitenberger, C. Eisenschmidt, H.-R. H?che
Position-resolved measurement of the polarization state in the forward-diffracted X-ray beam
Acta Cryst. A 52 (1996), 621-628 |
| |
|---|
|
H. Uniewski, J. Schreiber, S. Hildebrandt, H. S. Leipner
SEM CL studies on polar glide dislocations in CdTe
Mater. Sci. Eng. B 42 (1996), 313-316 |
| |
|---|
| H. S. Leipner, R. Scholz, F. Syrowatka, H. Uniewski, J. Schreiber
Study of copper aggregations at dislocations in GaAs
Mater. Sci. Eng. B 42 (1996), 186-189 |
| |
|---|
|
Schneider R., Syrowatka F., R?der A., Abicht H.-P., Woltersdorf J.
Identification of barium titanate phases by ELNES fingerprints
XI Europ. Congr. on Microscopy, Dublin 1996, Proc. CD-ROM T11-34 (1996), |
| |
|---|
|
F. Syrowatka, R. Scholz, H. Uniewski, J. Schreiber, H. S. Leipner
Wechselwirkung von Kupfer mit Versetzungen in GaAs
In: Rasterelektronenmikroskopie in der Materialpr?fung. Berlin: Deutscher Verband f?r Materialforschung und -pr?fung (1996), 287-292 |
| |
|---|
10 | 20 | 30 | 40 | 50 | 60 | 70 | 80 | 90 | 100 | 110 | 120 | 130 | 140 | 150 | 160 | 170 | 180 | 190 | 200 | 210 | 220 | 230 | 240 | 250 | 260 | 270 | 280 | 290 | 300 | 310 | 320 | 330 | 340 | 350 | 360 | 370 | 380 | 390 | 400 | 410 | 420 | 430 | 440 | 450 | 460 | 470 | 480 | 490 |500 | 510 | All
|
|
|
|
