Interdisziplinäres Zentrum für Materialwissenschaften
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      Nanotechnikum
Martin-Luther-Universität
Interdisziplinäres Zentrum für Materialwissenschaften
Nanotechnikum Weinberg
Heinrich-Damerow-Str. 4,
D-06120 Halle, Germany
Tel.: +49 345 55 28471
Telefax:+49 345 55 27390 email: info@cmat.uni-halle.de
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unfortunately no abstract available R. Krause-Rehberg, H. S. Leipner, A. Polity, F. Rudolf, R. Hammer, M. Jurisch
Mechanical damage in GaAs wafers introduced by a diamond saw: A study by means of positron annihilation and electron microscopy
phys. stat. sol. (a) 158,2 (1998), 377-383
 
abstractC. Medrano, F. Heyroth, M. Schlenker, J. Baruchel and J.Espeso
Two- and Three-Beam X-ray Diffraction Imaging of Domains in Magnetite
J. Appl. Cryst. 31 (1998), 726-732
 
unfortunately no abstract available U. Schmidt, C. Eisenschmidt, A. M. Zahra
The Kinetics of the Amorphous-Crystalline Transition in AlDyT-Alloys
Proceedings of ICAA-6, Aluminium Alloys Vol. 3 (1998), 1765-1770
 
unfortunately no abstract available U. Schmidt, C. Eisenschmidt, A. M. Zahra
The Kinetics of the Amorphous-Cristalline Transition in AlDyT-Alloys
Proceedings of the 6th Intern. Conf.nce on Aluminium Alloys, ICAA-6, Toyohashi (1998), 787
 
abstractS. Hildebrandt, J. Schreiber, W. Hergert, H. Uniewski, H. S. Leipner
Theoretical fundamentals and experimental materials and defect studies using quantitative scanning electron microscopy-cathodoluminescence/electron beam induced current on compound semiconductors
Scanning Microsc. Intern. 12, 4 (1998), 535-552
 
abstractH.-R. H?che
Wie die Bienen "Werkstoff" sparen...
Scientia halensis 2 (1998), 3-4
 
unfortunately no abstract available Neumann-Zdralek J., Koschel F., R?der A., Abicht H.-P., Engler N., Riemann A.
Nanoscopical phase-analysis of SiC containing BaTiO3-ceramic
Fresenius J. Anal. Chem. 361 (1998), 562-564
 
unfortunately no abstract available S. Gablenz, D. V?ltzke, H.-P. Abicht, J. Neumann-Zdralek
Preparation of fine TiO2 powders via spray hydrolysis of titanium tetraisopropoxide
J. Mater. Sci. Lett. 17, 7 (1998), 537-539
 
unfortunately no abstract available Wellner A., Katzer D., Blumtritt H., R?der A.
High resolution EBIC imaging of shallow p-n junction using FEG-SEM
Proc. GADEST (1998), 442-444
 
abstractR. Krause-Rehberg, H. S. Leipner, T. Abgarjan, A. Polity
Review of defect investigations by means of positron annihilation in II-VI compound semiconductors
Appl. Phys. A 66 (1998), 599-614
 
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