The BIAMS conference series was inaugurated in 1988 in Paris and followed by conferences in France, Italy, Spain, Germany, and Russia. The BIAMS 2010 is the direct follower of the conferences of 2006 held in St. Petersburg and 2008 in Toledo (Spain).
The conference "Beam Injection Assessment of Microstructures in Semiconductors" will be held in the city of Halle (Germany) from July 4 to 8, 2010.

The Workshop deals with theoretical and experimental topics related to the assessment of defects and nano- and microstructures in semiconductors by beam injection and related methods. The Workshop will act as a forum for interaction between physicists, materials scientists and technologists working in this field.

    Otwin Breitenstein
(Conference Chairman)