Interdisziplinäres Zentrum für Materialwissenschaften
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      Nanotechnikum
Martin-Luther-Universität
Interdisziplinäres Zentrum für Materialwissenschaften
Nanotechnikum Weinberg
Heinrich-Damerow-Str. 4,
D-06120 Halle, Germany
Tel.: +49 345 55 28471
Telefax:+49 345 55 27390 email: info@cmat.uni-halle.de
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abstractMartin Schade, Nadine Geyer, Bodo Fuhrmann, Frank Heyroth, Hartmut S. Leipner
High-resolution analytical electron microscopy of catalytically etched silicon nanowires
Appl. Phys. A 95 (2009), 325-327
 
abstractIngmar Ratschinski, Frank Heyroth, Wolfgang Fränzel, Hartmut S. Leipner
Anisotropy of crack and dislocation formation in GaAs
phys. stat. sol. (c) (2009),
 
abstractC. Patzig, B. Fuhrmann, H. S. Leipner, B. Rauschenbach
Silicon nanocolumns on nanosphere lithography templated substrates: Effects of sphere size and substrate temperature
J. Nanosci. Nanotechnol. 8, 12 (2008), 1-7
 
abstractC. Patzig, B. Rauschenbach, B. Fuhrmann, H. S. Leipner
Growth of Si nanorods in honeycomb and hexagonal-closed-packed arrays using glancing angle deposition
J. Appl. Phys. 103 (2008), 024313
 
abstractH. S. Leipner, M. Kittler
Preface
phys. stat. sol. (c) 4, 8 (2007), VIII
 
abstractH. S. Leipner (Ed.)
Proceedings of the International conference on Extended defects in semiconductors (EDS 2006)
Weinheim: Wiley-VCH (2007),
 
abstractM. Schade, F. Heyroth, F. Syrowatka, H. S. Leipner, T. Boeck, M. Hanke
Investigation of the chemical composition profile of SiGe/Si(001) islands by analytical transmission electron microscopy
Appl. Phys. Lett. 90 (2007), 263101
 
abstractJ. Bauer, V. Gottschalch, H. Paetzelt, G. Wagner, B. Fuhrmann, H. S. Leipner
MOVPE growth and real structure of vertical-aligned GaAs nanowires
J. Cryst. Growth 298 (2007), 625-630
 
unfortunately no abstract available M. Schade, F. Heyroth, H. S. Leipner, M. Hanke
Combined HRXRD and EELS investigations of SiGe/Si(001) islands grown by means of liquid phase epitaxy.
Microsc. Microanal. 13 (2007), Suppl. 3
 
abstractJ. Zhang, F. Paumier, T. H?che, F. Heyroth, F. Syrowatka, R. J. Gaboriaud, H. S. Leipner
Electron energy-loss spectroscopy investigations of Y2O3 films on Si (001) substrate
Thin Sol. Films 496 (2006), 266-272
 
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